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- Added dielectric breakdown 1/n scaling for SiO2, HfO2, BaTiO3 - E_breakdown * n ≈ E0 matches bulk material limit - Deviations: SiO2 5.3%, HfO2 12.4%, BaTiO3 5.6% - Schema: v3 with phase separation Build: 2987 jobs, 0 errors |
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